In the field of electron microscopy electrons are used to visualize and analyze the structure, morphology and composition of a sample at an atomic level achieving a resolution up to 50 pm. Usually, either with a “parallel” electron beam or scanned with an electron probe an atomic-level understanding of structures, properties and fundamental mechanisms in structural, functional and electronic materials can be gained.
| Network | Infrastructure | Instrument | Country | Link |
|---|---|---|---|---|
| non-ARIE | CERIC-ERIC |
FEI Titan Krios 3Gi@SOLARIS |
Europe | More details |
| non-ARIE | CERIC-ERIC | FE-SEM@CUP | Europe | More details |
| non-ARIE | CERIC-ERIC | JEOL JEM ARM 200F@NIMP | Europe | More details |
| e-dream | CNR | Jeol JEM 2010F FEG UHR TEM/STEM | IT | |
| e-dream | CNR | ZEISS FEGSEM Supra 40 | IT | More details |
| e-dream | ER-C | FEI Helios NanoLab 400S FIB-SEM | DE | More details |
| e-dream | ER-C | FEI Helios NanoLab 460F1 FIB-SEM | DE | More details |
| e-dream | ER-C | FEI Tecnai G2 F20 | DE | More details |
| e-dream | ER-C | FEI Titan 80-300 STEM | DE | More details |
| e-dream | ER-C | FEI Titan 80-300 TEM | DE | More details |
| e-dream | ER-C | FEI Titan G2 60-300 HOLO | DE | More details |
| e-dream | ER-C | FEI Titan G2 80-200 ChemiSTEM | DE | More details |
| e-dream | ER-C | FEI Titan G3 50-300 PICO | DE | More details |
| e-dream | ER-C | Hitachi HF 5000 TEM/STEM | DE | More details |
| e-dream | ER-C | TESCAN Tensor | DE | No web page yet |
| e-dream | ER-C | TFS Spectra 300 | DE | More details |
| laserlab | HiLASE | SEM | CZ | More details |
| e-dream | ICN2 | FEI MAGELLAN 400L SEM | ES | More details |
| e-dream | ICN2 | FEI Quanta 650F ESEM | ES | More details |
| e-dream | ICN2 | FEI Tecnai F20 (S)TEM | ES | More details |
| e-dream | ICN2 | Thermo Fisher SPECTRA 300 | ES | No web page yet |
| laserlab | IF | Scanning electron microscope (SEM) | HR | No web page yet |