In the field of electron microscopy electrons are used to visualize and analyze the structure, morphology and composition of a sample at an atomic level achieving a resolution up to 50 pm. Usually, either with a “parallel” electron beam or scanned with an electron probe an atomic-level understanding of structures, properties and fundamental mechanisms in structural, functional and electronic materials can be gained.
| Network | Country | Infrastructure | Instrument | Link |
|---|---|---|---|---|
| e-DREAM | IT | CNR | SEM laboratory | More details |
| TEM laboratory | More details | |||
| DE | ER-C | FEI Helios NanoLab 400S FIB-SEM | More details | |
| FEI Helios NanoLab 460F1 FIB-SEM | More details | |||
| FEI Tecnai G2 F20 | More details | |||
| FEI Titan 80-300 STEM | More details | |||
| FEI Titan 80-300 TEM | More details | |||
| FEI Titan G2 60-300 HOLO | More details | |||
| FEI Titan G2 80-200 ChemiSTEM | More details | |||
| FEI Titan G3 50-300 PICO | More details | |||
| Hitachi HF 5000 TEM/STEM | More details | |||
| TESCAN Tensor | More details | |||
| TFS Spectra 300 | More details | |||
| ES | ICN2 | FEI MAGELLAN 400L SEM | More details | |
| FEI Quanta 650F ESEM | More details | |||
| FEI Tecnai F20 (S)TEM | More details | |||
| Thermo Fisher SPECTRA 300 | No web page yet | |||
| non-ARIE | Europe | CERIC-ERIC@CUP | FE-SEM@CUP | More details |
| CERIC-ERIC@NIMP | JEOL JEM ARM 200F@NIMP | More details | ||
| CERIC-ERIC@SOLARIS | FEI Titan Krios 3Gi@SOLARIS | More details | ||
| Laserlab-Europe | CZ | HiLASE | Scanning electron microscope (SEM) | More details |
| HR | IF | Scanning electron microscope (SEM) | No web page yet |