Multiscale structural characterization by scanning SWAXS imaging

Zoom webinar | Replay on Youtube

Kim Nygård,
MAX IV, Sweden

Small- and wide-angle x-ray scattering (SWAXS) in scanning-imaging mode provides means to locally characterise the nanoscale structure of materials over macroscopic volumes. Here we will introduce the technique, provide a few illustrative examples, and discuss challenges for new users of the technique.