Focused ion beam

The focused ion beam (FIB) technique is a high-resolution imaging and microfabrication technology that uses a focused beam of ions to selectively remove or deposit material at the nanoscale level. FIB instruments are typically based on a scanning electron microscope (SEM) to visualize the sample and a focused beam of gallium ions to precisely remove or deposit material.

Network Country Infrastructure Instrument Link
RADIATE ES CNA 3 MeV Tandem Accelerator More details
FR GANIL GANIL More details

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DE IBC Helium Ion Microscopy More details
non-Ga FIB More details
CZ LT Ion beam lines at Tandetron More details
HR RBI-AF 1 MV Tandentron and 6 MV Tandem Van de Graaff More details

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e-DREAM DE ER-C FEI Helios NanoLab 400S FIB-SEM More details
FEI Helios NanoLab 460F1 FIB-SEM More details
ES ICN2 Thermo Fisher HELIOS 5UX FIB More details