BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//a hub for materials research - ECPv6.15.20//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-ORIGINAL-URL:https://remade-project.eu
X-WR-CALDESC:Events for a hub for materials research
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:Europe/Paris
BEGIN:DAYLIGHT
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
TZNAME:CEST
DTSTART:20240331T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0200
TZOFFSETTO:+0100
TZNAME:CET
DTSTART:20241027T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
TZNAME:CEST
DTSTART:20250330T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0200
TZOFFSETTO:+0100
TZNAME:CET
DTSTART:20251026T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
TZNAME:CEST
DTSTART:20260329T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0200
TZOFFSETTO:+0100
TZNAME:CET
DTSTART:20261025T010000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=Europe/Paris:20250829T100000
DTEND;TZID=Europe/Paris:20250829T110000
DTSTAMP:20260519T000740
CREATED:20250514T090757Z
LAST-MODIFIED:20250829T150813Z
UID:10000064-1756461600-1756465200@remade-project.eu
SUMMARY:3D elemental mapping with nanometer-scale resolution using atom probe tomography (APT)
DESCRIPTION:Zoom webinar | Replay on Youtube\nMasoud Dialameh\,  \nIMEC\, Belgium \nAtom probe tomography (APT) is a powerful microscopy technique that uniquely combines three-dimensional mapping of atomic distributions with the elemental identification for both light and heavy elements\, achieving sub-nanometer spatial resolution [1]. This capability enables a variety of analysis modes for materials characterization\, including voxel-based 3D composition analysis with parts-per-million sensitivity [1]\, cluster identification and characterization of solute clusters\, precipitates\, and segregated regions down to ~1 nm radius size [2]\, nearest-neighbour distribution analysis\, and proximity histograms for interface characterization. \nThe physical principle of APT is based on controlled field evaporation\, whereby atoms are sequentially removed from a needle-shaped specimen and identified using a position-sensitive detector coupled with time-of-flight mass spectrometry. This enables atomic-scale information to be obtained from local nanometer-sized regions of a material\, in contrast to most X-ray–based techniques that provide ensemble-averaged measurements over many atoms. APT requires specimen preparation in form of needle-shaped tips with a radius below 50 nm which typically involves focused ion beam (FIB) milling. \nThis webinar will provide a brief introduction to the fundamentals of APT\, including field evaporation process\, specimen preparation\, data acquisition\, and 3D data reconstruction. Selected case studies on materials relevant to the circular economy and the semiconductor industry will be presented\, with a focus on highlighting both the potential and the limitations of APT for analysis various material systems. \n  \nReferences \n[1] Gault\, Baptiste\, et al. “Atom probe tomography.” Nature Reviews Methods Primers 1.1 (2021): 51. \n[2] De Geuser\, Frédéric\, and Baptiste Gault. “Metrology of small particles and solute clusters by atom probe tomography.” Acta Materialia 188 (2020): 406-415.
URL:https://remade-project.eu/index.php/event/3d-elemental-mapping-with-nanometer-scale-resolution-using-atom-probe-tomography-apt/
CATEGORIES:Seminar
ATTACH;FMTTYPE=image/jpeg:https://remade-project.eu/wp-content/uploads/2025/05/250829_ReMade@ARI-seminar_Dialameh.jpg
END:VEVENT
END:VCALENDAR